Metrology and inspection cover BEOL applications.
Applied Materials · EvidencePROCESS STAGE
Back end of line
Back end of line refers to the interconnect portion of wafer processing. Metrology and inspection are used across front-end and back-end-of-line applications. BEOL wiring should be distinguished from the later assembly, packaging and test stages.
BEOLback-end-of-linemetal stack배선
Specifications
2 SOURCE-LINKED FIELDS| Context | Manufacturer / primary sourceApplied Materials Scope: concept |
|---|---|
| Associated operations | Manufacturer / primary sourceApplied Materials Scope: concept |
THE VISUAL EVIDENCE
0 DOCUMENTED SOURCESVisual sources
Help document this silicon.
We have not yet identified a reliable public visual source for this record. Suggest a die photograph, package image, paper or manufacturer diagram.
Follow the connections
1 SOURCE-LINKED RELATIONSHIPSSources and historical context
Metrology and inspection
Applied Materials · official-disclosure · primary source verified