VLSI KoreaProduct-series membership; does not assert shared masks or identical silicon.
Huawei · EvidenceVLSI MUSEUM / ENGINEERING RECORD2020
Huawei / HiSilicon5 nm
silicon design
The engineering record starts here.
We have not yet identified a reliable public die photograph for this record. Its identity and documented evidence remain open to explore.
SILICON DESIGN / 2020
HiSilicon Kirin 9000
Kirin 9000 is Huawei’s 2020 5-nanometer mobile flagship, documented with 15.3 billion transistors.
Research connections
Specifications
9 SOURCE-LINKED FIELDS| Identity & fabrication | |
|---|---|
| Year | Manufacturer / primary sourceHuawei Scope: silicon-die Source date: 2020-11-27 Year identifies first public introduction where a dated launch is available; see record notes for exceptions. |
| Process | Manufacturer / primary sourceHuawei Scope: silicon-die Source date: 2020-11-27 |
| Foundry | Published analysisKurnal Insights Scope: silicon-die Source date: 2026-05-05 Independent analyst attribution. |
| Packaging, power & physical analysis | |
| Transistor count | Manufacturer / primary sourceHuawei Scope: silicon-die Source date: 2020-11-27 |
| Reported die width | Published analysisKurnal Insights Scope: silicon-die Source date: 2026-05-05 Original analyst catalog value. Public entry gives dimensions but does not document calibration, die boundary convention, specimen provenance or uncertainty. |
| Reported die height | Published analysisKurnal Insights Scope: silicon-die Source date: 2026-05-05 Original analyst catalog value. Public entry gives dimensions but does not document calibration, die boundary convention, specimen provenance or uncertainty. |
| Reported die area | Published analysisKurnal Insights Scope: silicon-die Source date: 2026-05-05 Original analyst catalog value. Public entry gives dimensions but does not document calibration, die boundary convention, specimen provenance or uncertainty. |
| Verified die geometry | UnconfirmedHuawei Scope: silicon-die Source date: 2020-11-27 No source meeting calibrated geometry requirements accepted in this scout pass. Reported measurements, if present, remain separately labeled. |
| Die area | Independent measurementTechInsights Scope: One Kirin 9000 silicon die, comparative laboratory value TechInsights provides this value as the comparator in its Kirin 9000S laboratory findings. Width, height and die-edge convention are not supplied. |
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silicon design · HiSilicon Kirin 9000