SEMICONDUCTOR REFERENCE

반도체 컬렉션 탐색

제품·소자·공정·제조 장비의 사양과 원문 출처를 찾아보세요.

사양 조건 검색 문법

cores·threads·clock·boost·l2·l3·tdp·memory·year에 =, >=, <=, >, < 조건을 사용합니다. 기본 단위: GHz, MB, W, GB. 미확인·상충 값은 수치 조건에 포함하지 않습니다.

기업

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13 개 기록정렬

specimen

Source values retain units and entity scope. Open the citation on the record for conditions. Missing fields are unresearched; conflicting observations remain visible.
Compare	Entity	Subject	Package	Die area
	MSP430F122; die marked MSP430F123Texas Instruments · physical specimen	unresearched	unresearched	unresearched
	GD32F103CBT6 logic/SRAM dieGigaDevice · physical specimen	unresearched	unresearched	unresearched
	ATtiny4Atmel · physical specimen	unresearched	unresearched	unresearched
	ATtiny13AAtmel · physical specimen	unresearched	unresearched	unresearched
	1886VE10Milandr / Mikron · physical specimen	unresearched	unresearched	unresearched
	1986VE91T / MDR32F9Q2IMilandr · physical specimen	unresearched	unresearched	unresearched
	Nyquest NY8A051HNyquest Technology · physical specimen	unresearched	unresearched	unresearched
	WCH CH32V003Nanjing Qinheng Microelectronics (WCH) · physical specimen	unresearched	unresearched	unresearched
	Intel D87C51FCIntel · physical specimen	unresearched	unresearched	unresearched
	STM32F100C4T6BSTMicroelectronics · physical specimen	unresearched	unresearched	unresearched
	Milandr 1986VE21Milandr · physical specimen	unresearched	unresearched	unresearched
	Sinowealth SH79F1616PSinowealth · physical specimen	unresearched	unresearched	unresearched