SEMICONDUCTOR REFERENCE

Explore the collection

Find products, devices, processes and manufacturing tools with specifications and original sources.

Specification query syntax

Use cores, threads, clock, boost, l2, l3, tdp, memory or year with =, >=, <=, > or <. Units: GHz, MB, W, GB. Unknown or conflicting values do not match numeric conditions.

Results

158 records

cpu

Source values retain units and entity scope. Open the citation on the record for conditions. Missing fields are unresearched; conflicting observations remain visible.
CompareEntityCPU organizationClock / peakCacheProcess labelDie area
Intel Core i3 8100Intel · product model · 2017
4Cores3.6 GHzBase clock1 MBL2 cacheConflicting observations14 nmProcess126 mm²Die area
Intel Core i3 9100Intel · product model · 2018
4Cores3.6 GHzBase clock1 MBL2 cacheConflicting observations14 nmProcess126 mm²Die area
Intel Core i3 9100FIntel · product model · 2019
4Cores3.6 GHzBase clock1 MBL2 cacheConflicting observations14 nmProcess126 mm²Die area
Intel Core i3 9100T OEM/TrayIntel · product model · 2018
4Cores3.1 GHzBase clock1 MBL2 cache14 nmProcessunresearched
Intel Core i3 9300Intel · product model · 2019
4Cores3.7 GHzBase clock1 MBL2 cacheConflicting observations14 nmProcess126 mm²Die area
Intel Core i3 9300 OEM/TrayIntel · product model · 2019
4Cores3.7 GHzBase clock1 MBL2 cache14 nmProcessunresearched
Intel Core i3 9320Intel · product model · 2019
4Cores3.7 GHzBase clock1 MBL2 cache14 nmProcessunresearched
Intel Core i3 9320 OEM/TrayIntel · product model · 2019
4Cores3.7 GHzBase clock1 MBL2 cache14 nmProcessunresearched
Intel Core i3 9350KIntel · product model · 2019
4Cores4 GHzBase clock1 MBL2 cache14 nmProcessunresearched
Intel Core i3 9350K OEM/TrayIntel · product model · 2019
4Cores4 GHzBase clock1 MBL2 cache14 nmProcessunresearched
Intel Core i3 9350KFIntel · product model · 2019
4Cores4 GHzBase clock1 MBL2 cacheConflicting observations14 nmProcess126 mm²Die area
Intel Core i3-8350KIntel · product model · 2017
4Cores4 GHzBase clock1 MBL2 cacheConflicting observations14 nmProcess126 mm²Die area