SEMICONDUCTOR REFERENCE

Onto Innovation

Find products, devices, processes and manufacturing tools with specifications and original sources.

Specification query syntax

Use cores, threads, clock, boost, l2, l3, tdp, memory or year with =, >=, <=, > or <. Units: GHz, MB, W, GB. Unknown or conflicting values do not match numeric conditions.

Results

1 records

inspection/metrology

Capabilities apply to the named tool or family and the source’s configuration. Vendor throughput is not an independent benchmark. Missing fields are unresearched; conflicting observations remain visible.
CompareTool / familyProcess applicationTechnology / methodWafer / substrateCapability
Onto Innovation Firefly G5Onto Innovation · tool model
advanced IC substrates and panel-level packagingProcess application2D/3D metrology with on-tool color image captureMeasurement modesunresearchedunresearched