VLSI Korea
SEM image of SRAM structures, source label A4_19 — Chipwise specimen
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What silicon is this?
Look up exact or partial names, part numbers and documented aliases.
Matching records
40 candidate records across the Museum. A name or alias match does not verify an unknown physical specimen.
SEM image of deprocessed interconnects, source label A4_SEM_02 — Chipwise specimen
Electron micrograph of transistor gate structure — Chipwise specimen
Optical cross-section of a chip package and solder balls — Chipwise specimen
X-ray image of a packaged chip on a board — Chipwise specimen
Die microscopy and 3D profilometry comparison collage — Chipwise specimen
High-resolution optical die-region image VHX_000099 — Chipwise specimen
Montage of silicon die and die-mark microscope images — Chipwise specimen
3D surface profilometry of a circuit board — Chipwise specimen
Optical surface profilometry and die-detail measurement collage — Chipwise specimen
Die photograph labeled MT685555 in source filename — Chipwise specimen
Cubot smartphone — teardown specimen, model unidentified
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